Sensor Mikroskop Gaya Atom (Probe Atomic Force Microscopy)

Very High Quality Probe for Atomic Force Microscopy . It is designed for non-contact or tapping mode imaging . It is recommended if the feedback loop of the microscope does not accept high frequencies or if the detection system needs a minimum cantilever length (> 125 µm). This probe combines high operation stability with outstanding sensitivity. It is made from monolithic silicon which is highly doped to dissipate static charge. They are chemically inert and offer a high mechanical Q-factor for high sensitivity. The tip is shaped like a polygon based pyramid with a typical height of 10 - 15 µm.

For measurements on samples with sidewall angles approaching 90° we offer specially tailored tips showing a high aspect ratio portion with near-vertical sidewalls.

These probes offer unique features:
- length of the high aspect ratio portion of the tip > 2 µm
- typical aspect ratio of this portion in the order of 7:1 (when viewed from side as well as along cantilever axis)
- half cone angle of the high aspect ratio portion typically < 5°
- excellent tip radius of curvature.